宽度量化感知FinFET电路设计

IEEE Custom Integrated Circuits Conference 2006 Pub Date : 2006-12-01 DOI:10.1109/CICC.2006.320916

Jie Gu, J. Keane, S. Sapatnekar, C. Kim

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引用次数: 42

摘要

本文提出了一种基于FinFET器件独特宽度量化特性的统计泄漏估计方法。蒙特卡罗模拟结果表明，传统方法对FinFET器件的平均漏电流的估计低估了43%，而本文提出的方法给出了精确的估计，误差小于5%。动态逻辑电路的设计实例表明了该方法的有效性

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Width Quantization Aware FinFET Circuit Design

This paper presents a statistical leakage estimation method for FinFET devices considering the unique width quantization property. Monte Carlo simulations show that the conventional approach underestimates the average leakage current of FinFET devices by as much as 43% while the proposed approach gives a precise estimation with an error less than 5%. Design example on dynamic logic circuits shows the effectiveness of the proposed method

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IEEE Custom Integrated Circuits Conference 2006

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