{"title":"相控阵扫描用铁电移相器的表征及应用[BST陶瓷]","authors":"P. Teo, K. A. Jose, V. K. Varadan","doi":"10.1109/ICMMT.2000.895651","DOIUrl":null,"url":null,"abstract":"A novel beam scanning method utilizing bulk ferroelectric materials is presented. S21 phase shifts of up to 148/spl deg/ could be achieved from the phase shifter via analogous variation of a DC bias. When integrated into a phased array, beam scanning of at least /spl plusmn/12/spl deg/ is achieved prior to any optimization.","PeriodicalId":354225,"journal":{"name":"ICMMT 2000. 2000 2nd International Conference on Microwave and Millimeter Wave Technology Proceedings (Cat. No.00EX364)","volume":"37 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2000-09-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Characterization and application of ferroelectric phase shifters for phased array scanning [BST ceramics]\",\"authors\":\"P. Teo, K. A. Jose, V. K. Varadan\",\"doi\":\"10.1109/ICMMT.2000.895651\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A novel beam scanning method utilizing bulk ferroelectric materials is presented. S21 phase shifts of up to 148/spl deg/ could be achieved from the phase shifter via analogous variation of a DC bias. When integrated into a phased array, beam scanning of at least /spl plusmn/12/spl deg/ is achieved prior to any optimization.\",\"PeriodicalId\":354225,\"journal\":{\"name\":\"ICMMT 2000. 2000 2nd International Conference on Microwave and Millimeter Wave Technology Proceedings (Cat. No.00EX364)\",\"volume\":\"37 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2000-09-14\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"ICMMT 2000. 2000 2nd International Conference on Microwave and Millimeter Wave Technology Proceedings (Cat. No.00EX364)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICMMT.2000.895651\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"ICMMT 2000. 2000 2nd International Conference on Microwave and Millimeter Wave Technology Proceedings (Cat. No.00EX364)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICMMT.2000.895651","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Characterization and application of ferroelectric phase shifters for phased array scanning [BST ceramics]
A novel beam scanning method utilizing bulk ferroelectric materials is presented. S21 phase shifts of up to 148/spl deg/ could be achieved from the phase shifter via analogous variation of a DC bias. When integrated into a phased array, beam scanning of at least /spl plusmn/12/spl deg/ is achieved prior to any optimization.