{"title":"基于反射的微波器件s参数测量的去嵌入技术","authors":"F. Ghannouchi, A. Brodeur, F. Beauregard","doi":"10.1109/CPEM.1994.333424","DOIUrl":null,"url":null,"abstract":"A generalized calibration and de-embedding technique for reflection-based S-parameter measurements of microwave devices is proposed. This technique allows to perform the two-port calibration of a network analyzer directly from the embedded reflection coefficient measurements. This technique is a general one, in the sense that it can be implemented in network analyzers with or without transmission measurement capabilities.<<ETX>>","PeriodicalId":388647,"journal":{"name":"Proceedings of Conference on Precision Electromagnetic Measurements Digest","volume":"10 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1994-06-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"A de-embedding technique for reflection-based S-parameters measurements of microwave devices\",\"authors\":\"F. Ghannouchi, A. Brodeur, F. Beauregard\",\"doi\":\"10.1109/CPEM.1994.333424\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A generalized calibration and de-embedding technique for reflection-based S-parameter measurements of microwave devices is proposed. This technique allows to perform the two-port calibration of a network analyzer directly from the embedded reflection coefficient measurements. This technique is a general one, in the sense that it can be implemented in network analyzers with or without transmission measurement capabilities.<<ETX>>\",\"PeriodicalId\":388647,\"journal\":{\"name\":\"Proceedings of Conference on Precision Electromagnetic Measurements Digest\",\"volume\":\"10 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1994-06-27\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of Conference on Precision Electromagnetic Measurements Digest\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CPEM.1994.333424\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of Conference on Precision Electromagnetic Measurements Digest","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CPEM.1994.333424","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A de-embedding technique for reflection-based S-parameters measurements of microwave devices
A generalized calibration and de-embedding technique for reflection-based S-parameter measurements of microwave devices is proposed. This technique allows to perform the two-port calibration of a network analyzer directly from the embedded reflection coefficient measurements. This technique is a general one, in the sense that it can be implemented in network analyzers with or without transmission measurement capabilities.<>