千兆级CMOS VLSI的建模、仿真与布局综合

S. Kang
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引用次数: 0

摘要

仅给出摘要形式,如下。随着CMOS技术的不断发展,我们正在接近具有更低功耗要求的千兆级VLSI集成时代。对于VLSI社区的任何成员来说,许多CAD模型的有效性在深亚微米技术中变得过时并不奇怪。此外,所需芯片复杂性的增长速度比设计师在更短的设计周期内所能承受的要快得多。为了控制设计复杂性和控制VLSI芯片设计工作量的增加,使VLSI电路的布局完全自动化是至关重要的,并且最终的布局满足所有设计目标,如时间、面积、可靠性约束和高良率。在这里,作者考虑了深亚微米技术的新型MOS模型,VLSI电路的快速精确仿真技术,MOS可靠性建模和诊断以及时序驱动布局CMOS合成技术。考虑了FPGA、基于标准单元的设计和完全定制的设计案例。对于FPGA来说,时序驱动分区是随着新的CAD工具发展趋势而被考虑的。对于基于标准单元的设计,讨论了以最小面积满足时序和低功耗约束的栅极尺寸技术。对于完全定制设计,讨论了紧凑布局平台,三金属布线技术和晶体管尺寸算法的集成环境。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Modeling, simulation and layout synthesis for giga scale CMOS VLSI
Summary form only given, as follows. With continuing proliferation of CMOS technology, we are approaching the era of giga-scale VLSI integration with lower power requirement. It would not be surprising to any member of the VLSI community that the validity of many CAD models become obsolete in the deep submicron technology. Also, the required chip complexity increases faster than what designers can afford in even shorter design cycle time. In order to manage the design complexity and contain the increase in the design effort of VLSI chips, it is critically important to fully automate the layout of VLSI circuits in a manner the finished layout meets all the design objectives such as timing, area, reliability constraints with high yield. Here the author considers new MOS models for deep submicron technologies, fast and accurate simulation techniques for VLSI circuits, MOS reliability modeling and diagnosis, and timing-driven layout CMOS synthesis techniques. FPGA, standard cells based design and full custom design cases are considered. For FPGA, timing-driven partitioning is considered along with new CAD tool development trends. For standard cells based design, gate sizing techniques for meeting timing and low-power constraints with minimum area are discussed. For full custom design, an integrated environment for compact layout platforms, triple metal routing techniques and transistor sizing algorithms is discussed.
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