{"title":"少射学习的相似-差异关系网络","authors":"Changhu Cheng, Yang Peng","doi":"10.1109/AIID51893.2021.9456570","DOIUrl":null,"url":null,"abstract":"Few-shot learning aims to build a classification model by training a small amount of labeled sample data, which can be well adapted to new domains. The key point of few-shot learning is that a small amount of sample data cannot reflect the true data distribution. Training on a small amount of sample data will lead to over-fitting of the deep neural network model. The differences between different categories are ignored when using similarity measures for classification. This paper proposes a novel few-shot learning method based on similarity-difference relation network, which uses shallow wide residual network to extract the features of the training dataset and fuses them into a category prototype. Meanwhile, SDRN pays attention to the characterization of similarities and differences between positive and negative samples. This paper verifies the effectiveness of the similarity-difference relational network on the Mini-ImageNet and Tiered-ImageNet datasets. The experimental results show that the similarity-difference two-way relational network further improves image classification accuracy in the few-shot learning task.","PeriodicalId":412698,"journal":{"name":"2021 IEEE International Conference on Artificial Intelligence and Industrial Design (AIID)","volume":"14 8 Pt 1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-05-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Similarity-Difference Relation Network for Few-Shot Learning\",\"authors\":\"Changhu Cheng, Yang Peng\",\"doi\":\"10.1109/AIID51893.2021.9456570\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Few-shot learning aims to build a classification model by training a small amount of labeled sample data, which can be well adapted to new domains. The key point of few-shot learning is that a small amount of sample data cannot reflect the true data distribution. Training on a small amount of sample data will lead to over-fitting of the deep neural network model. The differences between different categories are ignored when using similarity measures for classification. This paper proposes a novel few-shot learning method based on similarity-difference relation network, which uses shallow wide residual network to extract the features of the training dataset and fuses them into a category prototype. Meanwhile, SDRN pays attention to the characterization of similarities and differences between positive and negative samples. This paper verifies the effectiveness of the similarity-difference relational network on the Mini-ImageNet and Tiered-ImageNet datasets. The experimental results show that the similarity-difference two-way relational network further improves image classification accuracy in the few-shot learning task.\",\"PeriodicalId\":412698,\"journal\":{\"name\":\"2021 IEEE International Conference on Artificial Intelligence and Industrial Design (AIID)\",\"volume\":\"14 8 Pt 1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2021-05-28\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2021 IEEE International Conference on Artificial Intelligence and Industrial Design (AIID)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/AIID51893.2021.9456570\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2021 IEEE International Conference on Artificial Intelligence and Industrial Design (AIID)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/AIID51893.2021.9456570","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Similarity-Difference Relation Network for Few-Shot Learning
Few-shot learning aims to build a classification model by training a small amount of labeled sample data, which can be well adapted to new domains. The key point of few-shot learning is that a small amount of sample data cannot reflect the true data distribution. Training on a small amount of sample data will lead to over-fitting of the deep neural network model. The differences between different categories are ignored when using similarity measures for classification. This paper proposes a novel few-shot learning method based on similarity-difference relation network, which uses shallow wide residual network to extract the features of the training dataset and fuses them into a category prototype. Meanwhile, SDRN pays attention to the characterization of similarities and differences between positive and negative samples. This paper verifies the effectiveness of the similarity-difference relational network on the Mini-ImageNet and Tiered-ImageNet datasets. The experimental results show that the similarity-difference two-way relational network further improves image classification accuracy in the few-shot learning task.