有机场效应晶体管的理论与建模

Gernot Paasch, S. Scheinert, R. Tecklenburg
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引用次数: 3

摘要

在有机FET (OFET)中,有源层是一种有机材料。到目前为止,测量的电流特性都是用最简单的电流方程来分析的。但是OFET的设计在电子学中并不常见。正如我们对类似硅器件的二维模拟所证明的那样,这种设计导致了几个特点。我们开发了包含这些特性的分析模型,并以小于3 - 5%的误差再现了模拟的电流特性。作为第一个应用,我们拟合了OFET的电流特性,并以这种方式确定了材料参数。零场迁移率μ0较低,表示跳跃输运。大的平坦带电压必须来自氧化物/界面电荷。对于跳变系统,只有假设到目前为止速度饱和度未知,才有可能得到满意的拟合。比值vs/μ0 ~ 1.5⋅104V/cm可以从理论上解释。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Theory and modelling of organic field effect transistors
In organic FET ́s (OFET) the active layer is an organic material. Until now measured current characteristics have been analyzed by using the most simple equation for the current. But the design of the OFET is not common in electronics. As demonstrated by our 2D simulations of analogous silicon devices this design leads to several peculiarities. We developed analytical models which incorporate these peculiarities and reproduce the simulated current characteristics with less than 3 to 5% error. As first applications we fitted published current characteristics of OFET ́s and determined in this way material parameters. Zero field mobility μ0 is low and indicate hopping transport. Large flat band voltages must origin from oxide/interface charges. Satisfactory fits are possible only by assuming velocity saturation unknown till now for hopping systems. The ratio vs/μ0 ~ 1.5⋅104V/cm can be explained theoretically.
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