{"title":"一种诊断测试生成方法","authors":"A. B. Carroll, M. Kato, Y. Koga, K. Naemura","doi":"10.1145/1476793.1476830","DOIUrl":null,"url":null,"abstract":"A variety of diagnostic techniques have been proposed and applied to error detection and location in computers. The efficiency of the tests generated by them varies from machine to machine depending on the scale of the system, its logic organiztion, and the employed hardware technology. The impact of highly integrated circuitry is changing the trend in logical design of computers.","PeriodicalId":326625,"journal":{"name":"AFIPS '69 (Spring)","volume":"2 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1899-12-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":"{\"title\":\"A method of diagnostic test generation\",\"authors\":\"A. B. Carroll, M. Kato, Y. Koga, K. Naemura\",\"doi\":\"10.1145/1476793.1476830\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A variety of diagnostic techniques have been proposed and applied to error detection and location in computers. The efficiency of the tests generated by them varies from machine to machine depending on the scale of the system, its logic organiztion, and the employed hardware technology. The impact of highly integrated circuitry is changing the trend in logical design of computers.\",\"PeriodicalId\":326625,\"journal\":{\"name\":\"AFIPS '69 (Spring)\",\"volume\":\"2 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1899-12-30\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"6\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"AFIPS '69 (Spring)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1145/1476793.1476830\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"AFIPS '69 (Spring)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/1476793.1476830","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A variety of diagnostic techniques have been proposed and applied to error detection and location in computers. The efficiency of the tests generated by them varies from machine to machine depending on the scale of the system, its logic organiztion, and the employed hardware technology. The impact of highly integrated circuitry is changing the trend in logical design of computers.
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