PHB探测聚合物的低温结构弛豫

Satomi Tanaka, S. Machida, K. Horie, T. Yamashita
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引用次数: 1

摘要

光化学烧孔(PHB)作为一种频域光存储技术正引起人们的关注。此外,PHB有望成为了解聚合物在低温下动态行为的探针。聚合物的低温特性已经在机械和电介质上进行了多年的研究。本研究研究了发色团/聚合物体系的空穴分布对偏移温度的依赖关系,并将其与聚合物的力学和介电行为进行了比较,从而掌握了聚合物的弛豫性质与化学结构之间的关系。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Low-Temperature Structural Relaxation in Polymers Probed by PHB
Photochemical hole burning (PHB) is attracting an interest as a means for frequency-domain optical storage. Besides, PHB is expected as a probe for understanding the dynamic behavior in polymers at low temperatures. The low-temperature properties of polymers have been investigated mechanically and dielectricly for many years. In the present study, excursion temperature dependence of hole profile for chromophore/polymer systems is investigated, and is compared with mechanical and dielectric behavior of polymers, so as to get hold of the relationship between relaxation properties and chemical structure of polymers.
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