镍电镀掩模SiC蚀刻的表面工程

Nour Beydoun, M. Lazar, Xavier Gassmann
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引用次数: 2

摘要

本文研究了用于碳化硅(SiC)衬底深度等离子体刻蚀的镍刻蚀掩模,旨在制造功率集成器件。由于传统的薄膜物理气相沉积(PVD)方法的兼容性较差,因此在进行SiC深度蚀刻时需要具有显著厚度的Ni掩模。采用电镀镍掩膜,得到了均匀光滑的等离子蚀刻SiC表面,且无微掩膜现象。这里详细介绍了我们开发的这种基于Ni掩模的技术,超越了其局限性,以获得高蚀刻厚度的碳化硅衬底。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Surface engineering for SiC etching with Ni electroplating masks
This study reports research on Nickel etch mask used for deep plasma etching of silicon carbide (SiC) substrates, aiming to fabricate power integrated devices. Ni masks with significant thicknesses are requested when performing deep etches of SiC, which are less compatible with classic thin film physical vapor deposition (PVD) methods. Uniform and smooth plasma etched surfaces of SiC were obtained without micromasking phenomena upon using Ni masks deposed by electroplating. Detailed here is this Ni masks based technology we developed beyond its limitation, in order to obtain a high-etched thickness of silicon carbide substrates.
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