D. Khera, L. W. Linholm, R. A. Allen, M. Cresswell, V.C. Tyree, W. Hansford, C. Pina
{"title":"基于测试结构测量的机器学习程序的知识验证","authors":"D. Khera, L. W. Linholm, R. A. Allen, M. Cresswell, V.C. Tyree, W. Hansford, C. Pina","doi":"10.1109/ICMTS.1990.161729","DOIUrl":null,"url":null,"abstract":"The authors describe an approach for evaluating and refining the rules, based on test structure measurements, to be entered into the knowledge base of an expert system that characterizes device performance. The objective is to qualify the performance of rules determined by a machine-learning classification application with the best knowledge available from the human experts. The technique combines a machine-learning approach with the traditional heuristic-based development of an expert system. Strengths and weaknesses of the individual techniques are compared.<<ETX>>","PeriodicalId":417292,"journal":{"name":"Proceedings of the 1991 International Conference on Microelectronic Test Structures","volume":"26 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1990-03-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Knowledge verification of machine-learning procedures based on test structure measurements\",\"authors\":\"D. Khera, L. W. Linholm, R. A. Allen, M. Cresswell, V.C. Tyree, W. Hansford, C. Pina\",\"doi\":\"10.1109/ICMTS.1990.161729\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The authors describe an approach for evaluating and refining the rules, based on test structure measurements, to be entered into the knowledge base of an expert system that characterizes device performance. The objective is to qualify the performance of rules determined by a machine-learning classification application with the best knowledge available from the human experts. The technique combines a machine-learning approach with the traditional heuristic-based development of an expert system. Strengths and weaknesses of the individual techniques are compared.<<ETX>>\",\"PeriodicalId\":417292,\"journal\":{\"name\":\"Proceedings of the 1991 International Conference on Microelectronic Test Structures\",\"volume\":\"26 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1990-03-18\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the 1991 International Conference on Microelectronic Test Structures\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICMTS.1990.161729\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 1991 International Conference on Microelectronic Test Structures","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICMTS.1990.161729","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Knowledge verification of machine-learning procedures based on test structure measurements
The authors describe an approach for evaluating and refining the rules, based on test structure measurements, to be entered into the knowledge base of an expert system that characterizes device performance. The objective is to qualify the performance of rules determined by a machine-learning classification application with the best knowledge available from the human experts. The technique combines a machine-learning approach with the traditional heuristic-based development of an expert system. Strengths and weaknesses of the individual techniques are compared.<>