薄膜光学特性的太赫兹近场成像表征

2018 Photonics North (PN) Pub Date : 2018-06-01 DOI:10.6084/M9.FIGSHARE.C.4477607.V1

F. Amirkhan, R. Nechache, R. Sakata, K. Takiguchi, T. Arikawa, T. Ozaki, K. Tanaka, F. Blanchard

{"title":"薄膜光学特性的太赫兹近场成像表征","authors":"F. Amirkhan, R. Nechache, R. Sakata, K. Takiguchi, T. Arikawa, T. Ozaki, K. Tanaka, F. Blanchard","doi":"10.6084/M9.FIGSHARE.C.4477607.V1","DOIUrl":null,"url":null,"abstract":"We present a method for characterization of thin-film eletro-or magneto-optic materials. Our tool is based on resolving the electric and magnetic field distributions in the near field of a split ring resonator (SRR) designed for the terahertz frequency range. Here, we experimentally validate our simulations by near-field THz imaging of a SRR directly patterned in contact with a thin-film lithium niobate crystal.","PeriodicalId":423625,"journal":{"name":"2018 Photonics North (PN)","volume":"26 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Characterization of Thin-Film Optical Properties by THz Near-Field Imaging\",\"authors\":\"F. Amirkhan, R. Nechache, R. Sakata, K. Takiguchi, T. Arikawa, T. Ozaki, K. Tanaka, F. Blanchard\",\"doi\":\"10.6084/M9.FIGSHARE.C.4477607.V1\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We present a method for characterization of thin-film eletro-or magneto-optic materials. Our tool is based on resolving the electric and magnetic field distributions in the near field of a split ring resonator (SRR) designed for the terahertz frequency range. Here, we experimentally validate our simulations by near-field THz imaging of a SRR directly patterned in contact with a thin-film lithium niobate crystal.\",\"PeriodicalId\":423625,\"journal\":{\"name\":\"2018 Photonics North (PN)\",\"volume\":\"26 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2018-06-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2018 Photonics North (PN)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.6084/M9.FIGSHARE.C.4477607.V1\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 Photonics North (PN)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.6084/M9.FIGSHARE.C.4477607.V1","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 0

摘要

我们提出了一种表征薄膜电光或磁光材料的方法。我们的工具是基于解决在太赫兹频率范围内设计的分裂环谐振器(SRR)近场的电场和磁场分布。在这里，我们通过实验验证了我们的模拟，通过近场太赫兹成像的SRR直接与薄膜铌酸锂晶体接触。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

查看原文本刊更多论文

Characterization of Thin-Film Optical Properties by THz Near-Field Imaging

We present a method for characterization of thin-film eletro-or magneto-optic materials. Our tool is based on resolving the electric and magnetic field distributions in the near field of a split ring resonator (SRR) designed for the terahertz frequency range. Here, we experimentally validate our simulations by near-field THz imaging of a SRR directly patterned in contact with a thin-film lithium niobate crystal.

求助全文

通过发布文献求助，成功后即可免费获取论文全文。去求助

来源期刊

2018 Photonics North (PN)

自引率

0.00%

发文量