硅基光伏用硅/锗纳米点超晶格

Philip Barletta, G. Dezsi, M. Lee, C. Yi, R. Venkatasubramanian
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引用次数: 0

摘要

我们通过低压化学气相沉积法生长了硅/锗纳米点超晶格,以分析其作为薄膜太阳能电池的性能。自组装的锗纳米点包含在基区,以促进近红外光子的吸收,并增加短路电流密度。在相对较低的点密度5.5×l09 cm−2下,20周期和40周期电池的填充系数为70%,开路电压(Voc)为0.51V,与先前报道的分子束外延生长的器件密切匹配。在λ= 400-550 nm范围内,20周期和40周期电池的光谱响应率相似,但40周期电池的基底较厚,使其在550-900 nm范围内获得更高的光谱响应率。当我们将点密度增加55%,同时将周期数保持在40时,由于更低的带隙和更高的位错密度,Voc显著下降。将基于硅纳米材料的光伏器件与超薄硅光伏器件集成的工作正在进行中,以获得更高的效率,并最大限度地减少硅的使用。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Si/Ge nanodot superlattices for Si-based photovoltaics
We have grown Si/Ge nanodot superlattices via low-pressure chemical vapor deposition in order to analyze their performance as thin-film solar cells. Self-assembled Ge nanodots are included in the base region in order to boost absorption of near-infrared photons and to increase short-circuit current density, Jsc. At a relatively low dot density of 5.5×l09 cm−2, both 20- and 40-period cells exhibited a fill factor of 70% and open-circuit voltage (Voc) of 0.51V, closely matching previously reported devices grown by molecular beam epitaxy. The 20- and 40-period cells had similar spectral responsivity for λ=400–550 nm, but the thicker base of the 40-period cell enabled it to attain higher responsivity for wavelengths in the range of 550–900 nm. When we increased the dot density by 55% while holding the number of periods at 40, Voc dropped significantly due to a combination of lower bandgap and higher dislocation density. Work is in progress to integrate such SiGe-nano-materials based PV devices with ultra-thin Si PV, to obtain higher efficiencies as well as minimize the use of Si.
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