{"title":"细胞扫描重现","authors":"C. Gloster, F. Brglez","doi":"10.1109/SSST.1992.712271","DOIUrl":null,"url":null,"abstract":"In this paper, we re-examine the concept of test machine embedding and present a specific test machine architecture: cellular scan. This architecture offers advantages both over traditional scan as well as circular scan. Compared to traditional scan, cellular scan shortens required test time with vectors generated deterministically. Compared to circular scan, cellular scan requires less hardware, has no limitations on state coverage, and can significantly improve random pattern testability of sequential logic.","PeriodicalId":359363,"journal":{"name":"The 24th Southeastern Symposium on and The 3rd Annual Symposium on Communications, Signal Processing Expert Systems, and ASIC VLSI Design System Theory","volume":"8 2 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1992-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Cellular Scan Revisited\",\"authors\":\"C. Gloster, F. Brglez\",\"doi\":\"10.1109/SSST.1992.712271\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper, we re-examine the concept of test machine embedding and present a specific test machine architecture: cellular scan. This architecture offers advantages both over traditional scan as well as circular scan. Compared to traditional scan, cellular scan shortens required test time with vectors generated deterministically. Compared to circular scan, cellular scan requires less hardware, has no limitations on state coverage, and can significantly improve random pattern testability of sequential logic.\",\"PeriodicalId\":359363,\"journal\":{\"name\":\"The 24th Southeastern Symposium on and The 3rd Annual Symposium on Communications, Signal Processing Expert Systems, and ASIC VLSI Design System Theory\",\"volume\":\"8 2 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1992-03-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"The 24th Southeastern Symposium on and The 3rd Annual Symposium on Communications, Signal Processing Expert Systems, and ASIC VLSI Design System Theory\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/SSST.1992.712271\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"The 24th Southeastern Symposium on and The 3rd Annual Symposium on Communications, Signal Processing Expert Systems, and ASIC VLSI Design System Theory","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SSST.1992.712271","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
In this paper, we re-examine the concept of test machine embedding and present a specific test machine architecture: cellular scan. This architecture offers advantages both over traditional scan as well as circular scan. Compared to traditional scan, cellular scan shortens required test time with vectors generated deterministically. Compared to circular scan, cellular scan requires less hardware, has no limitations on state coverage, and can significantly improve random pattern testability of sequential logic.