走向自动化的福柯刀口定量检验

G. Rodríguez, J. Villa, G. Martínez, I. de la Rosa, R. Ivanov
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引用次数: 5

摘要

鉴于越来越需要简单、经济、可靠的方法和仪器来进行镜面和透镜等光学表面的质量测试,近年来,我们从物理光学的角度重新开始了对被遗忘已久的福柯刀口测试的研究,最终获得了一个封闭的数学表达式,直接将刀口沿位移近轴的位置与可观测的辐照度模式联系起来。这后来使我们能够提出一种定量的方法来估计非球面反射镜的波前误差,其精度类似于干涉测量法。在这项工作中,我们提出了一种进一步改进的数字图像处理算法,该算法将用于计算每个相关强度-照度剖面的瞬态斜率点的s型代价函数替换为简化版本,从而使整个波前梯度估计过程更加稳定和高效,同时,基于傅里叶的梯度积分算法也被正则化的二次成本函数所取代,该函数更容易引入函数的感兴趣区域(ROI),通过线性梯度共轭法求解,大大提高了算法的整体精度和效率。我们的方法的这种修订方法可以很容易地由市场上大多数单板微控制器实现和处理,因此可以实现完全集成的自动化测试设备,甚至为独立光学反射镜分析仪原型的提议开辟了现实的道路。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Towards the automatization of the Foucault knife-edge quantitative test
Given the increasing necessity of simple, economical and reliable methods and instruments for performing quality tests of optical surfaces such as mirrors and lenses, in the recent years we resumed the study of the long forgotten Foucault knife-edge test from the point of view of the physical optics, ultimately achieving a closed mathematical expression that directly relates the knife-edge position along the displacement paraxial axis with the observable irradiance pattern, which later allowed us to propose a quantitative methodology for estimating the wavefront error of an aspherical mirror with precision akin to interferometry. In this work, we present a further improved digital image processing algorithm in which the sigmoidal cost-function for calculating the transient slope-point of each associated intensity-illumination profile is replaced for a simplified version of it, thus making the whole process of estimating the wavefront gradient remarkably more stable and efficient, at the same time, the Fourier based algorithm employed for gradient integration has been replaced as well for a regularized quadratic cost-function that allows a considerably easier introduction of the region of interest (ROI) of the function, which solved by means of a linear gradient conjugate method largely increases the overall accuracy and efficiency of the algorithm. This revised approach of our methodology can be easily implemented and handled by most single-board microcontrollers in the market, hence enabling the implementation of a full-integrated automatized test apparatus, opening a realistic path for even the proposal of a stand-alone optical mirror analyzer prototype.
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