氢化物气相外延在NdGaO/ sub3 /上生长GaN薄膜及其取向

A. Wakahara, T. Nishida, K. Kawano, A. Yoshida, Y. Seki, O. Oda
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引用次数: 1

摘要

研究了氮化镓在NdGaO/sub 3/[011]和(101)衬底上的氢化物气相外延生长特性。发现GaN(0001)/NdGaO/sub 3/[011]与GaN[10-10]//NdGaO/sub 3/[100]的外延关系,以及GaN(11-24)/NdGaO/sub 3/[101]与GaN[11-2-4]//NdGaO/sub 3/[10-1]的外延关系。当氮化镓直接生长在NdGaO3/sub /衬底上,温度约为1000℃时,由于nh3 /sub /的存在使NdGaO3/sub /衬底在高温下减少,没有氮化镓的沉积。为了避免衬底的减少,低温生长的GaN作为保护层是有效的。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Growth and orientation of GaN epilayers on NdGaO/sub 3/ by hydride vapor phase epitaxy
Growth characteristics of GaN on NdGaO/sub 3/ [011] and (101) substrates by hydride vapor phase epitaxy are investigated. The epitaxial relationship is found to be GaN(0001)/NdGaO/sub 3/ [011] with GaN [10-10]//NdGaO/sub 3/ [100] for NdGaO/sub 3/ [011] and GaN(11-24)/NdGaO/sub 3/[101] with GaN[11-2-4]//NdGaO/sub 3/ [10-1] for the NdGaO/sub 3/ [101]. When the GaN is directly grown on NdGaO3/sub /substrates around 1000/spl deg/C, no deposits of GaN are obtained due to the reduction of the NdGaO3/sub s/ substrate by the presence of NH/sub 3/ at high temperature. In order to avoid the substrate reduction, low-temperature grown GaN is effective as the protective layer.
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