SET:用于学习和训练基于扫描的DFT原理及其对嵌入式系统参数的影响的交互式工具

13th Annual IEEE International Symposium and Workshop on Engineering of Computer-Based Systems (ECBS'06) Pub Date : 2006-03-27 DOI:10.1109/ECBS.2006.65

Josef Strnadel, Z. Kotásek

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引用次数: 0

摘要

本文介绍了扫描设计学习与训练工具的升级版，介绍了可测性技术原理及其对嵌入式系统参数的影响。为了说明嵌入式系统的设计参数与诊断参数之间的关系，概述了该工具在教育过程中的应用

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SET: interactive tool for learning and training scan-based DFT principles and their consequences to parameters of embedded system

In the paper, upgraded version of our tool for learning and training of scan design for testability technique principles and its consequences to parameters of embedded system is presented. It is outlined how the tool can be utilized in education process in order to illustrate relation between design and diagnostic parameters of embedded system

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来源期刊

13th Annual IEEE International Symposium and Workshop on Engineering of Computer-Based Systems (ECBS'06)

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