Dynamical reliability estimation and critical state early detection by application of FIDES guide 2009

This article presents an approach to dynamical assessing the reliability of electronic systems. Such an assessment can be done on the basis of information collected for a given set of factors describing various aspects of the life of the system, and affecting its reliability. The reliability is assessed by applying the methodology proposed in FIDES guide 2009 by evaluating the failure rates of electronic system items and their current deviations from the values previously accepted as normal.