{"title":"纳米尺度下的微观场效应及其对高速电子器件设计的意义","authors":"C. Krowne","doi":"10.1109/EMCSI.2018.8495436","DOIUrl":null,"url":null,"abstract":"Materials & Devices - Microscopic Effects Important • Phase Change & Metal-Insulation Transition Materials • Superconductive Materials & Devices • Nanowires, NanoTubes, and NanoCables (1D systems) • Electric Materials & Devices 1. Ferroelectric (FM), 2. Ant-FE, and electron charge effects like Coulomb blockage • Negative Index Materials • Magnetic Materials & Devices 1. Ferromagnetic (FM), 2. Ferrimagnetc (FiM), 3. Ant-FM and 4. Correlated electron system magnetics • Single and few atomic layered materials; e.g., graphene, BN, MoS<inf>2</inf> (2D systems) • Topological Insulators","PeriodicalId":120342,"journal":{"name":"2018 IEEE Symposium on Electromagnetic Compatibility, Signal Integrity and Power Integrity (EMC, SI & PI)","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2018-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Microscopic Field Effects at the NanoScale Level and Their Implications for Device Design in High-Speed Electronics\",\"authors\":\"C. Krowne\",\"doi\":\"10.1109/EMCSI.2018.8495436\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Materials & Devices - Microscopic Effects Important • Phase Change & Metal-Insulation Transition Materials • Superconductive Materials & Devices • Nanowires, NanoTubes, and NanoCables (1D systems) • Electric Materials & Devices 1. Ferroelectric (FM), 2. Ant-FE, and electron charge effects like Coulomb blockage • Negative Index Materials • Magnetic Materials & Devices 1. Ferromagnetic (FM), 2. Ferrimagnetc (FiM), 3. Ant-FM and 4. Correlated electron system magnetics • Single and few atomic layered materials; e.g., graphene, BN, MoS<inf>2</inf> (2D systems) • Topological Insulators\",\"PeriodicalId\":120342,\"journal\":{\"name\":\"2018 IEEE Symposium on Electromagnetic Compatibility, Signal Integrity and Power Integrity (EMC, SI & PI)\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2018-07-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2018 IEEE Symposium on Electromagnetic Compatibility, Signal Integrity and Power Integrity (EMC, SI & PI)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EMCSI.2018.8495436\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 IEEE Symposium on Electromagnetic Compatibility, Signal Integrity and Power Integrity (EMC, SI & PI)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EMCSI.2018.8495436","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}