{"title":"基于图像序列的椭圆形状亚像素参数估计","authors":"J. N. Reed, S. Hutchinson","doi":"10.1109/MFI.1994.398403","DOIUrl":null,"url":null,"abstract":"We present a method of ellipse parameter estimation that can be used in performing automated inspection of circular features. In our method, several digital images are taken of each part as it moves past a camera, creating an image sequence. Image enhancement is performed using the image sequence, yielding a high-resolution image. Subpixel edge detection is performed on the high-resolution image, producing a set of data points that is used for ellipse parameter estimation.<<ETX>>","PeriodicalId":133630,"journal":{"name":"Proceedings of 1994 IEEE International Conference on MFI '94. Multisensor Fusion and Integration for Intelligent Systems","volume":"25 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1994-10-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"Subpixel parameter estimation for elliptical shapes using image sequences\",\"authors\":\"J. N. Reed, S. Hutchinson\",\"doi\":\"10.1109/MFI.1994.398403\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We present a method of ellipse parameter estimation that can be used in performing automated inspection of circular features. In our method, several digital images are taken of each part as it moves past a camera, creating an image sequence. Image enhancement is performed using the image sequence, yielding a high-resolution image. Subpixel edge detection is performed on the high-resolution image, producing a set of data points that is used for ellipse parameter estimation.<<ETX>>\",\"PeriodicalId\":133630,\"journal\":{\"name\":\"Proceedings of 1994 IEEE International Conference on MFI '94. Multisensor Fusion and Integration for Intelligent Systems\",\"volume\":\"25 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1994-10-02\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of 1994 IEEE International Conference on MFI '94. Multisensor Fusion and Integration for Intelligent Systems\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/MFI.1994.398403\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of 1994 IEEE International Conference on MFI '94. Multisensor Fusion and Integration for Intelligent Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MFI.1994.398403","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Subpixel parameter estimation for elliptical shapes using image sequences
We present a method of ellipse parameter estimation that can be used in performing automated inspection of circular features. In our method, several digital images are taken of each part as it moves past a camera, creating an image sequence. Image enhancement is performed using the image sequence, yielding a high-resolution image. Subpixel edge detection is performed on the high-resolution image, producing a set of data points that is used for ellipse parameter estimation.<>