一种减少双轨逻辑差分互连电容不平衡引起的侧道泄漏的新方法

Jianping Quan, Guoqiang Bai
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引用次数: 5

摘要

近年来,抗DPA逻辑样式备受关注。据我们所知,每种逻辑风格都有其自身的缺点。屏蔽逻辑样式很容易受到模板攻击的攻击。对于双轨逻辑样式,TDPL只能保持整个周期的总功耗恒定;对于差分线来说,随着特征尺寸的不断缩小,如何有效匹配差分线的互连电容变得越来越困难。为了避免这些缺点,我们提出了解决不平衡互连问题的路由努力的新方向。通过采用三相逻辑并去除评估阶段和放电阶段的负载相关功耗,我们的逻辑方式对差动导线的不平衡互连电容不敏感。此外,早期传播效应是对某些抗DPA逻辑样式的另一个威胁。本文还提出了从系统层面解决该问题的理论方法。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A New Method to Reduce the Side-Channel Leakage Caused by Unbalanced Capacitances of Differential Interconnections in Dual-Rail Logic Styles
Recently DPA resistant logic styles are of great concern. As far as we know, each kind of logic style has its own drawbacks. Masking logic styles can easily be attacked by the template attack. For dual-rail logic styles, TDPL can only keep the total power consumption of the whole cycle constant; as for WDDL, it becomes more and more difficult to efficiently match the interconnect capacitances of differential wires with shrinking feature sizes. To avoid these drawbacks, we present a new direction for routing effort to solve the unbalanced interconnection problem. By using Three-phase logic and removing the load dependent power consumption in the evaluation phase and discharge phase, our logic style is insensitive to the unbalanced interconnect capacitances of differential wires. Additionally, the early propagation effect is another threat to certain DPA resistant logic styles. We also propose a theoretical method to solve it at the system level.
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