{"title":"用于近场微波和毫米波无损检测技术的新型探头设计","authors":"I. Ivanchenko, N. Popenko, R. Chernobrovkin","doi":"10.1109/MIKON.2006.4345378","DOIUrl":null,"url":null,"abstract":"Based on the numerical modeling the novel probe design for near field measurements is presented. The optimal electrodynamic characteristics of this probe with the dielectric insertion as melting quartz have been determined. It has been shown that the use of Teflon layer provides a good matching of wave impedances of the empty standard waveguide and reduced one. The testing probe instrument functions have been determined and expected values of resolving capacity are evaluated.","PeriodicalId":315003,"journal":{"name":"2006 International Conference on Microwaves, Radar & Wireless Communications","volume":"84 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2006-05-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Novel probe design for near field microwave and millimeter wave nondestructive testing techniques\",\"authors\":\"I. Ivanchenko, N. Popenko, R. Chernobrovkin\",\"doi\":\"10.1109/MIKON.2006.4345378\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Based on the numerical modeling the novel probe design for near field measurements is presented. The optimal electrodynamic characteristics of this probe with the dielectric insertion as melting quartz have been determined. It has been shown that the use of Teflon layer provides a good matching of wave impedances of the empty standard waveguide and reduced one. The testing probe instrument functions have been determined and expected values of resolving capacity are evaluated.\",\"PeriodicalId\":315003,\"journal\":{\"name\":\"2006 International Conference on Microwaves, Radar & Wireless Communications\",\"volume\":\"84 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2006-05-22\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2006 International Conference on Microwaves, Radar & Wireless Communications\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/MIKON.2006.4345378\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2006 International Conference on Microwaves, Radar & Wireless Communications","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MIKON.2006.4345378","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Novel probe design for near field microwave and millimeter wave nondestructive testing techniques
Based on the numerical modeling the novel probe design for near field measurements is presented. The optimal electrodynamic characteristics of this probe with the dielectric insertion as melting quartz have been determined. It has been shown that the use of Teflon layer provides a good matching of wave impedances of the empty standard waveguide and reduced one. The testing probe instrument functions have been determined and expected values of resolving capacity are evaluated.