XLIM实验室微波器件建模与表征研究进展

J. Nallatamby, J. Obregon, J. Nebus, M. Prigent, R. Quéré
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引用次数: 0

摘要

在过去十年中,微波应用的数量以令人印象深刻的方式增加。因此,设计库必须包含越来越多的通用设备模型。在我们的演讲中,我们将描述XLIM实验室(前身为IRCOM实验室)在半导体微波器件建模和表征领域所做的努力,以便为现代微波应用的设计开发准确的模型。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Advances on modelling and characterization of microwave devices at XLIM laboratory
During last decade the number of microwave applications augmented in an impressive manner. So, design libraries must include device models more and more versatile. In our presentation we will describe the endeavour undertaken at XLIM laboratory (formerly IRCOM laboratory), in the area of the modelling and characterization of semiconductor microwave devices in order to develop accurate models for the design of modern microwave applications.
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