基于光学性质调制的PET辐射检测方法中电子倍增效应的研究

Li Tao, H. Daghighian, C. Levin
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引用次数: 1

摘要

本文进一步探索了基于光学性质调制的PET电离辐射光子探测方法,作为显著提高符合时间分辨率的潜在新方向。我们比较了这种方法的三种探测器晶体的性能,包括两种碲化镉(CdTe)晶体和一种氧化铋硅(BSO)晶体在高达3500V的高偏置电压下的性能。我们首先证明了探测器晶体中的感应电流决定了电离引起的光学性质调制信号的强度。较大的电阻率有利于降低晶体中的暗电流(噪声),有利于检测微弱的光学性质调制信号。此外,我们还证明了BSO是一种潜在的候选探测器材料。当偏置在3500 V时,其调制信号灵敏度与偏置在1000V时的CdTe相当,但具有更高的电阻率(更低的噪声)、更大的511 keV光子衰减系数、更低的价格、更好的晶体表面光洁度和更小的毒性。通过研究调制信号幅度与晶体偏置电压的关系,我们发现调制信号幅度(由UV激光二极管和Ge-68源诱导)与晶体偏置电压成线性正比,线性拟合R因子约为0.95。当晶体偏置电压从0V到3500V时,紫外激光二极管照射CdTe和BSO诱导的调制信号幅度从0%增加到2%(归一化到平均信号电平)。晶体偏置电压从0V到1500 V时,CdTe的调制信号幅值从0%增加到12%;晶体偏置电压从0V到3500 V时,BSO的调制信号幅值从0%增加到10%。因此,电子倍增效应(高晶体偏压)有望显著提高调制信号幅度,最终目标是实现单个511 keV光子检测。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Investigation of electron multiplication effect in optical property modulation-based radiation detection method for PET
In this paper, we further explore the optical property modulation-based method for ionizing radiation photon detection in PET as a potential new direction to dramatically improve the coincidence time resolution. We compare the performance of three detector crystals for this method including two types of cadmium telluride (CdTe) crystals and one bismuth silicon oxide (BSO) crystal under high bias voltages up to 3500V. We first show that the induced current flow in the detector crystal determines the strength of the optical property modulation signal due to ionization. A larger resistivity is favorable for reducing the dark current (noise) in the crystal and facilitates the detection of weak optical property modulation signals. In addition, we show that BSO is a potential candidate detector material. When biased at 3500 V, it has comparable modulation signal sensitivity as CdTe biased at 1000V, but with higher resistivity (lower noise), larger 511 keV photon attenuation coefficient, lower price, better crystal surface finish quality, and less toxicity. By studying the dependence of modulation signal amplitude on crystal bias voltage, we show that the modulation signal amplitude (induced by both UV laser diode and Ge-68 source) is linearly proportional to crystal bias voltage with a linear fit R factor of around 0.95. The modulation signal amplitude induced by UV laser diode irradiation increases from 0% to 2% (normalized to the average signal level) for both CdTe and BSO under crystal bias voltage from 0V to 3500V. The modulation signal amplitude induced by Ge-68 irradiation increases from 0% to 12% for CdTe under crystal bias voltage from 0V to 1500 V, and increases from 0% to 10% for BSO under crystal bias voltage from 0V to 3500 V. Therefore the electron multiplication effect (with high crystal bias) shows promise to significantly boost the modulation signal amplitude with the ultimate goal to achieve single 511 keV photon detection.
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