S. Arima, Takuya Nagata, Huizhen Bu, Satsuki Shimada
{"title":"稀疏建模与主成分分析在综合多维质量虚拟计量中的应用","authors":"S. Arima, Takuya Nagata, Huizhen Bu, Satsuki Shimada","doi":"10.5220/0007385603540361","DOIUrl":null,"url":null,"abstract":"This paper discussed the virtual metrology (VM) modelling of multi-class quality to describe the relationship between the variables of a production machine's condition and the estimated/forecasted product quality soon after finishing the machine processing. Applications of PCA and LASSO technique of the Sparse modelling were introduced to define the multi-dimensional quality. Because the high accuracy and quick computations are required for the VM modelling, in this study, the PCA-LASSO combination was applied before building the VM models based on the kernel SVM (kSVM), particularly the linear kernel for real-time use. As the result of evaluation of a CVD (Chemical vapor deposition) process in an actual semiconductor factory, LASSO and linear-SVM could reduce the scale of the machine variable's set and calculation time by almost 57% and 95% without deterioration of accuracy even without PCA. In addition, as the PCA-LASSO, the multi-dimensional quality was rotated to the orthogonality space by PCA to summarize the extracted variables responding to the primary independent hyperspace. As the result of the PCA-LASSO combination, the scale of machine variables extracted was improved by 83%, besides the accuracy of the linear-SVM is 98%. It is also effective as the pre-process of Partial Least Square (PLS).","PeriodicalId":235376,"journal":{"name":"International Conference on Operations Research and Enterprise Systems","volume":"51 3-4 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-02-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"Applications of Sparse Modelling and Principle Component Analysis for the Virtual Metrology of Comprehensive Multi-dimensional Quality\",\"authors\":\"S. Arima, Takuya Nagata, Huizhen Bu, Satsuki Shimada\",\"doi\":\"10.5220/0007385603540361\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper discussed the virtual metrology (VM) modelling of multi-class quality to describe the relationship between the variables of a production machine's condition and the estimated/forecasted product quality soon after finishing the machine processing. Applications of PCA and LASSO technique of the Sparse modelling were introduced to define the multi-dimensional quality. Because the high accuracy and quick computations are required for the VM modelling, in this study, the PCA-LASSO combination was applied before building the VM models based on the kernel SVM (kSVM), particularly the linear kernel for real-time use. As the result of evaluation of a CVD (Chemical vapor deposition) process in an actual semiconductor factory, LASSO and linear-SVM could reduce the scale of the machine variable's set and calculation time by almost 57% and 95% without deterioration of accuracy even without PCA. In addition, as the PCA-LASSO, the multi-dimensional quality was rotated to the orthogonality space by PCA to summarize the extracted variables responding to the primary independent hyperspace. As the result of the PCA-LASSO combination, the scale of machine variables extracted was improved by 83%, besides the accuracy of the linear-SVM is 98%. It is also effective as the pre-process of Partial Least Square (PLS).\",\"PeriodicalId\":235376,\"journal\":{\"name\":\"International Conference on Operations Research and Enterprise Systems\",\"volume\":\"51 3-4 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2019-02-19\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"International Conference on Operations Research and Enterprise Systems\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.5220/0007385603540361\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"International Conference on Operations Research and Enterprise Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.5220/0007385603540361","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Applications of Sparse Modelling and Principle Component Analysis for the Virtual Metrology of Comprehensive Multi-dimensional Quality
This paper discussed the virtual metrology (VM) modelling of multi-class quality to describe the relationship between the variables of a production machine's condition and the estimated/forecasted product quality soon after finishing the machine processing. Applications of PCA and LASSO technique of the Sparse modelling were introduced to define the multi-dimensional quality. Because the high accuracy and quick computations are required for the VM modelling, in this study, the PCA-LASSO combination was applied before building the VM models based on the kernel SVM (kSVM), particularly the linear kernel for real-time use. As the result of evaluation of a CVD (Chemical vapor deposition) process in an actual semiconductor factory, LASSO and linear-SVM could reduce the scale of the machine variable's set and calculation time by almost 57% and 95% without deterioration of accuracy even without PCA. In addition, as the PCA-LASSO, the multi-dimensional quality was rotated to the orthogonality space by PCA to summarize the extracted variables responding to the primary independent hyperspace. As the result of the PCA-LASSO combination, the scale of machine variables extracted was improved by 83%, besides the accuracy of the linear-SVM is 98%. It is also effective as the pre-process of Partial Least Square (PLS).