{"title":"MEBS SOURCE软件包在高压电子枪设计中的应用","authors":"E. Munro, X. Zhu, J. Rouse","doi":"10.1109/IVELEC.2004.1316356","DOIUrl":null,"url":null,"abstract":"We report on results of the high-voltage electron guns modeling with MEBS SOURCE software, where not only gun electron-optical properties, but high-voltage isolation have been analyzed and optimized successfully.","PeriodicalId":283559,"journal":{"name":"Fifth IEEE International Vacuum Electronics Conference (IEEE Cat. No.04EX786)","volume":"33 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2004-04-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Application of the MEBS SOURCE software package to high voltage electron gun design\",\"authors\":\"E. Munro, X. Zhu, J. Rouse\",\"doi\":\"10.1109/IVELEC.2004.1316356\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We report on results of the high-voltage electron guns modeling with MEBS SOURCE software, where not only gun electron-optical properties, but high-voltage isolation have been analyzed and optimized successfully.\",\"PeriodicalId\":283559,\"journal\":{\"name\":\"Fifth IEEE International Vacuum Electronics Conference (IEEE Cat. No.04EX786)\",\"volume\":\"33 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2004-04-27\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Fifth IEEE International Vacuum Electronics Conference (IEEE Cat. No.04EX786)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IVELEC.2004.1316356\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Fifth IEEE International Vacuum Electronics Conference (IEEE Cat. No.04EX786)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IVELEC.2004.1316356","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Application of the MEBS SOURCE software package to high voltage electron gun design
We report on results of the high-voltage electron guns modeling with MEBS SOURCE software, where not only gun electron-optical properties, but high-voltage isolation have been analyzed and optimized successfully.
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