现代数据中心中电压互感器故障的案例研究:分析、缓解和解决方案实现

Tamer Abdelazim Mellik, T. Dionise, R. Yanniello
{"title":"现代数据中心中电压互感器故障的案例研究:分析、缓解和解决方案实现","authors":"Tamer Abdelazim Mellik, T. Dionise, R. Yanniello","doi":"10.1109/ICPS.2016.7490257","DOIUrl":null,"url":null,"abstract":"While preparing a modern data center for startup, the commissioning process involved primary circuit switching that resulted in two voltage transformer (VT) failures. As a result of these failures, the authors conducted a comprehensive investigation of the VT failures. As the investigation proceeded, VT ferroresonance on circuit opening, and high frequency switching transients on closing, emerged as possible root causes of the VT failures. After incorporating extensive transient simulations and three rounds of field transient measurements, the authors designed and implemented a complete solution that included sizing of snubbers to overcome excessive switching transients, and the development of a saturable reactor to protect voltage transformers against the effects of ferroresonance. This paper describes root cause(s), simulations, field measurements, recommend solution(s), and solution implementation. The correlation between field measurements and simulation results show the effectiveness of modeling the implemented solutions.","PeriodicalId":266558,"journal":{"name":"2016 IEEE/IAS 52nd Industrial and Commercial Power Systems Technical Conference (I&CPS)","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2016-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":"{\"title\":\"A case study of voltage transformer failures in a modern data center: Analysis, mitigation, and solution implementation\",\"authors\":\"Tamer Abdelazim Mellik, T. Dionise, R. Yanniello\",\"doi\":\"10.1109/ICPS.2016.7490257\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"While preparing a modern data center for startup, the commissioning process involved primary circuit switching that resulted in two voltage transformer (VT) failures. As a result of these failures, the authors conducted a comprehensive investigation of the VT failures. As the investigation proceeded, VT ferroresonance on circuit opening, and high frequency switching transients on closing, emerged as possible root causes of the VT failures. After incorporating extensive transient simulations and three rounds of field transient measurements, the authors designed and implemented a complete solution that included sizing of snubbers to overcome excessive switching transients, and the development of a saturable reactor to protect voltage transformers against the effects of ferroresonance. This paper describes root cause(s), simulations, field measurements, recommend solution(s), and solution implementation. The correlation between field measurements and simulation results show the effectiveness of modeling the implemented solutions.\",\"PeriodicalId\":266558,\"journal\":{\"name\":\"2016 IEEE/IAS 52nd Industrial and Commercial Power Systems Technical Conference (I&CPS)\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-05-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"6\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 IEEE/IAS 52nd Industrial and Commercial Power Systems Technical Conference (I&CPS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICPS.2016.7490257\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE/IAS 52nd Industrial and Commercial Power Systems Technical Conference (I&CPS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICPS.2016.7490257","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 6

摘要

在准备启动现代数据中心时,调试过程涉及一次电路切换,导致两个电压互感器(VT)故障。由于这些故障,作者对VT故障进行了全面的调查。随着调查的深入,开路时的VT铁磁谐振和合闸时的高频开关瞬变可能是VT故障的根本原因。在结合了大量的瞬态模拟和三轮现场瞬态测量后,作者设计并实施了一个完整的解决方案,其中包括减小缓冲器的尺寸以克服过度的开关瞬态,以及开发可饱和电抗器以保护电压互感器免受铁共振的影响。本文描述了根本原因、模拟、现场测量、建议的解决方案和解决方案的实现。现场测量结果与仿真结果之间的相关性表明了所实现方案建模的有效性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A case study of voltage transformer failures in a modern data center: Analysis, mitigation, and solution implementation
While preparing a modern data center for startup, the commissioning process involved primary circuit switching that resulted in two voltage transformer (VT) failures. As a result of these failures, the authors conducted a comprehensive investigation of the VT failures. As the investigation proceeded, VT ferroresonance on circuit opening, and high frequency switching transients on closing, emerged as possible root causes of the VT failures. After incorporating extensive transient simulations and three rounds of field transient measurements, the authors designed and implemented a complete solution that included sizing of snubbers to overcome excessive switching transients, and the development of a saturable reactor to protect voltage transformers against the effects of ferroresonance. This paper describes root cause(s), simulations, field measurements, recommend solution(s), and solution implementation. The correlation between field measurements and simulation results show the effectiveness of modeling the implemented solutions.
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