MEMS惯性传感器中微碎片产生的临界冲击能量求解

L. G. Pagani, L. Guerinoni, L. Falorni, P. Fedeli, G. Langfelder
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引用次数: 0

摘要

这项工作提出了一个一致的后续研究,以确定悬浮多晶硅质量对挡板的临界冲击能量[1],以防止产生影响MEMS惯性传感器寿命稳定性的碎片和颗粒。所提出的测试装置能够通过监测质量阻截器接触区域下方埋置电极之间的泄漏电流来检测碎片的产生。结果表明,冲击能为15 nJ时开始出现泄漏,冲击能为25 nJ时,100%的被试结构都出现泄漏。器件开封后的光学分析证实了预测,验证了测试方法。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Finding the critical impact energy for micro debris generation in MEMS inertial sensors
The work presents a consistent follow-up on a study to identify the critical impact energy of suspended polysilicon masses onto stoppers [1], to prevent creation of debris and particles which affect the lifetime stability of MEMS inertial sensors. The proposed test device is capable of detecting debris generation by monitoring the leakage current between buried electrodes underneath the mass-stopper contact region. Results indicate that leakage begins to appear at 15 nJ impact energy, and manifests on 100% of tested structures at energies of 25 nJ. Optical analyses after device uncapping confirm the prediction, validating the test method.
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