A. Patterson, Enes Calayir, G. Fedder, G. Piazza, B. Soon, Navab Singh
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Application of statistical element selection to 3D integrated AlN MEMS filters for performance correction and yield enhancement
By 3D integration of an array of 12 nominally identical AlN MEMS sub-filters with a CMOS switching matrix and application of statistical element selection to the same system, we have built a self-healing filter offering 495 unique filter responses and a tuning range of 500 kHz for both center frequency and bandwidth. The demonstrated system enables correction of intrinsic, fabrication-induced variation in filter performance that would otherwise constitute a severe yield limitation to the manufacture of standalone filters.