用于激光等离子体诊断的主动探测激光系统的研究

Xiaodong Yuan, Xiaofeng Wei, Chengcheng Wang, Xinwu Qing, W. Deng, Bin Xu, D. Jiang, Jun Tang, H. Jia
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引用次数: 0

摘要

为了精确测量激光等离子体中电子器件的温度和密度,在XG-II激光设备上建立了两个探测激光系统。其中紫外探测激光系统经四次谐波转换后,通过级联拉曼压缩器输出持续时间为30 ps的紫外激光脉冲,用于激光等离子体的密度测量。另一种是可提供能量为3 ~ 5J的4 ω激光脉冲的汤姆逊散射系统,目前已被常规应用于激光等离子体的电子温度诊断。首次利用探针激光在同一次发射中直接测量激光等离子体的密度和温度。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Study on active probe laser system used for laser plasma diagnostic
To measure the temperature and density of electronics in laser plasma accurately, two probe laser systems are built on XG-II laser facility. The one, called UV probe laser system, which can provide the UV laser pulse with duration of 30 ps by cascade Raman compressor after fourth harmonic conversion is used for density measurement of laser plasma. The other one, Thomson scattering system, which can provide the 4 ω laser pulse with energy of 3 - 5J, is now routinely operated for electronics temperature diagnostic in laser plasma. It is the first time that the density and temperature of laser plasma are measured directly by probe laser at the same shot.
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