{"title":"受折射率随机波动扰动的光波前的测定","authors":"A. Poularikas, C. Katsinis","doi":"10.1109/SSST.1988.17046","DOIUrl":null,"url":null,"abstract":"A method is presented by which the random amplitude and phase at any particular point of a wavefront may be determined. The only information needed is the electrical output of a detector the excitations of which is due to the integration of the incoming and a reference wave. The reference wave is the result of a point source.<<ETX>>","PeriodicalId":345412,"journal":{"name":"[1988] Proceedings. The Twentieth Southeastern Symposium on System Theory","volume":"119 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1988-03-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Determination of optical wavefronts perturbed by random fluctuations of the index refraction\",\"authors\":\"A. Poularikas, C. Katsinis\",\"doi\":\"10.1109/SSST.1988.17046\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A method is presented by which the random amplitude and phase at any particular point of a wavefront may be determined. The only information needed is the electrical output of a detector the excitations of which is due to the integration of the incoming and a reference wave. The reference wave is the result of a point source.<<ETX>>\",\"PeriodicalId\":345412,\"journal\":{\"name\":\"[1988] Proceedings. The Twentieth Southeastern Symposium on System Theory\",\"volume\":\"119 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1988-03-20\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"[1988] Proceedings. The Twentieth Southeastern Symposium on System Theory\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/SSST.1988.17046\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"[1988] Proceedings. The Twentieth Southeastern Symposium on System Theory","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SSST.1988.17046","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Determination of optical wavefronts perturbed by random fluctuations of the index refraction
A method is presented by which the random amplitude and phase at any particular point of a wavefront may be determined. The only information needed is the electrical output of a detector the excitations of which is due to the integration of the incoming and a reference wave. The reference wave is the result of a point source.<>