利用光学各向异性快速表征大面积石墨烯的结构质量

Yu-Lun Liu, Hsuen‐Li Chen, Yu Chen-Chieh, Cheng-Yi Fang
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引用次数: 0

摘要

我们发现石墨烯薄膜的光学各向异性在大面积石墨烯薄膜的快速表征中起着重要的作用。为了快速测定石墨烯薄膜的光学各向异性,提出了变角光谱法。与拉曼散射光谱等其他方法不同,这种方法可以在不使用复杂光学装置的情况下,对CVD石墨烯薄膜的结构质量进行快速、廉价和大面积的表征。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Rapidly characterize structural qualities of large-area graphene by optical anisotropy
We find that optical anisotropy of graphene films which play an important role as an alternative quality factor for the rapid characterization of large-area graphene films. Angle-variable spectroscopy method is developed to rapidly determine the optical anisotropy of graphene films. Unlike other approaches such like Raman scattering spectroscopy, this method allows ready, cheap, and large-area characterization of the structural qualities of CVD graphene films without the application of complicated optical setups.
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