基于Shack-Hartmann波前传感器的大孔径光学测试装置

SPIE OPTO Pub Date : 2016-03-16 DOI:10.1117/12.2219282

A. Nikitin, J. Sheldakova, A. Kudryashov, G. Borsoni, D. Denisov, V. Karasik, A. Sakharov

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引用次数: 21

摘要

本文考虑了两种广泛应用于大孔径光学器件测试的方法:菲索干涉仪和沙克-哈特曼波前传感器。菲索干涉仪是一种常用的光学检测仪器，利用沙克-哈特曼波前传感器可以将菲索干涉仪改造成一种检测大口径光学元件的替代技术。我们称这种装置为哈特曼干涉仪，并将其特点与菲索干涉仪进行比较。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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A device based on the Shack-Hartmann wave front sensor for testing wide aperture optics

In this paper we consider two approaches widely used in testing of wide aperture optics: Fizeau interferometer and Shack-Hartmann wavefront sensor. Fizeau interferometer that is common instrument in optical testing can be transformed to a device using Shack-Hartmann wavefront sensor, the alternative technique to check wide aperture optical components. We call this device Hartmannometer, and compare its features to those of Fizeau interferometer.

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