Xueshen Wang, Tianyi Li, D. Cox, J. Gallop, Jinjin Li, Y. Zhong, W. Cao, Q. Zhong, Zhun Li, Mingyu Zhang, L. Hao
{"title":"基于纳米桥结的铌纳米squid研究","authors":"Xueshen Wang, Tianyi Li, D. Cox, J. Gallop, Jinjin Li, Y. Zhong, W. Cao, Q. Zhong, Zhun Li, Mingyu Zhang, L. Hao","doi":"10.1109/CPEM.2016.7540718","DOIUrl":null,"url":null,"abstract":"NanoSQUIDs with Dayem nanobridge weak-link junctions were fabricated on single layer niobium film by focus ion beam(FIB) milling. The dimension of the nanobridge is less than 60 nm and the loop scale is from 400×400 nm to 2.5×20 μm. The working temperature range for this device was researched. The voltage-flux transfer properties were measured at different working temperatures.","PeriodicalId":415488,"journal":{"name":"2016 Conference on Precision Electromagnetic Measurements (CPEM 2016)","volume":"274 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-07-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Investigation of niobium nanoSQUIDs based on nanobridge junctions\",\"authors\":\"Xueshen Wang, Tianyi Li, D. Cox, J. Gallop, Jinjin Li, Y. Zhong, W. Cao, Q. Zhong, Zhun Li, Mingyu Zhang, L. Hao\",\"doi\":\"10.1109/CPEM.2016.7540718\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"NanoSQUIDs with Dayem nanobridge weak-link junctions were fabricated on single layer niobium film by focus ion beam(FIB) milling. The dimension of the nanobridge is less than 60 nm and the loop scale is from 400×400 nm to 2.5×20 μm. The working temperature range for this device was researched. The voltage-flux transfer properties were measured at different working temperatures.\",\"PeriodicalId\":415488,\"journal\":{\"name\":\"2016 Conference on Precision Electromagnetic Measurements (CPEM 2016)\",\"volume\":\"274 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-07-10\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 Conference on Precision Electromagnetic Measurements (CPEM 2016)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CPEM.2016.7540718\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 Conference on Precision Electromagnetic Measurements (CPEM 2016)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CPEM.2016.7540718","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Investigation of niobium nanoSQUIDs based on nanobridge junctions
NanoSQUIDs with Dayem nanobridge weak-link junctions were fabricated on single layer niobium film by focus ion beam(FIB) milling. The dimension of the nanobridge is less than 60 nm and the loop scale is from 400×400 nm to 2.5×20 μm. The working temperature range for this device was researched. The voltage-flux transfer properties were measured at different working temperatures.