特征码分析中的时空相关误差

Digest of Papers Eleventh Annual 1993 IEEE VLSI Test Symposium Pub Date : 1993-04-06 DOI:10.1109/VTEST.1993.313357

G. Edirisooriya, S. Edirisooriya, John P. Robinson

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引用次数: 8

摘要

提出了一种同时考虑空间和时间相关性的误差模型。得到了一大类签名寄存器在任意测试长度下混叠概率的精确封闭表达式。作者确定了属于这类的最小寄存器结构。

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Time and space correlated errors in signature analysis

A new error model that considers both space and time correlation is proposed. An exact closed form expression for aliasing probability is obtained for an arbitrary test length for a large class of signature registers. The authors identify the minimum register structure that falls into this class.<>

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Digest of Papers Eleventh Annual 1993 IEEE VLSI Test Symposium

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