{"title":"基于测量的放大器设计","authors":"B. Toner, V. Fusco","doi":"10.1109/HFPSC.2001.962172","DOIUrl":null,"url":null,"abstract":"In this paper, the development of a turnkey, multi-functional measurement system is described. It is electronically reconfigurable and allows for the on-wafer design of an amplifier to a given specification. All primary amplifier measurements can be completed such as S-parameters, minimum noise figure, source/load pull, harmonic power and intermodulation. In addition, real time voltage/current waveforms of the amplifier can be monitored and dynamic loadlines produced. The requirement for more linear amplifiers has also been addressed in this paper with the low frequency feedback technique being implemented for the first time on MOS technology and on-wafer.","PeriodicalId":129428,"journal":{"name":"6th IEEE High Frequency Postgraduate Colloquium (Cat. No.01TH8574)","volume":"22 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2001-09-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Measurement based amplifier design\",\"authors\":\"B. Toner, V. Fusco\",\"doi\":\"10.1109/HFPSC.2001.962172\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper, the development of a turnkey, multi-functional measurement system is described. It is electronically reconfigurable and allows for the on-wafer design of an amplifier to a given specification. All primary amplifier measurements can be completed such as S-parameters, minimum noise figure, source/load pull, harmonic power and intermodulation. In addition, real time voltage/current waveforms of the amplifier can be monitored and dynamic loadlines produced. The requirement for more linear amplifiers has also been addressed in this paper with the low frequency feedback technique being implemented for the first time on MOS technology and on-wafer.\",\"PeriodicalId\":129428,\"journal\":{\"name\":\"6th IEEE High Frequency Postgraduate Colloquium (Cat. No.01TH8574)\",\"volume\":\"22 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2001-09-09\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"6th IEEE High Frequency Postgraduate Colloquium (Cat. No.01TH8574)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/HFPSC.2001.962172\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"6th IEEE High Frequency Postgraduate Colloquium (Cat. No.01TH8574)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/HFPSC.2001.962172","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
In this paper, the development of a turnkey, multi-functional measurement system is described. It is electronically reconfigurable and allows for the on-wafer design of an amplifier to a given specification. All primary amplifier measurements can be completed such as S-parameters, minimum noise figure, source/load pull, harmonic power and intermodulation. In addition, real time voltage/current waveforms of the amplifier can be monitored and dynamic loadlines produced. The requirement for more linear amplifiers has also been addressed in this paper with the low frequency feedback technique being implemented for the first time on MOS technology and on-wafer.
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