电子束致细胞损伤的评价

2014 IEEE 5th International Conference on Photonics (ICP) Pub Date : 2014-09-01 DOI:10.1109/ICP.2014.7002316

Daiki Horiba, Y. Nawa, Taichi Furukawa, W. Inami, Y. Kawata

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引用次数: 1

摘要

研究了电子束辐照对活细胞的损伤。用荧光显微镜观察细胞活力。通过比较电子束辐照前后的荧光图像来评价电子束致损伤。电子束辐照后，细胞表面出现与细胞损伤有关的气泡，细胞活力信号减弱。

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Evaluation of cell damage induced by electron beam

We evaluate the damage on living cells induced by electron beam irradiation. Cell viability is observed with a fluorescence microscope. Electron beam induced damage is evaluated by the comparison of fluorescence images obtained before and after the electron beam irradiation. After electron beam irradiation, a bleb related to cell injury was observed and cell viability signal was decreased on the irradiated cell.

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2014 IEEE 5th International Conference on Photonics (ICP)

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