{"title":"无栅全结纳米线晶体管量子力学阈值电压的自洽确定","authors":"Nujhat Tasneem, M. Adnan, M. Hafiz, Q. Khosru","doi":"10.1109/ICECE.2016.7853874","DOIUrl":null,"url":null,"abstract":"Quantum definition based threshold voltage calculation of Gate-All-Around Junction Less Nanowire Transistor has been presented in this work. Employment of this approach has not yet been achieved on GAA-JLNT even though similar determination was previously established for TG FinFETs and GAA-MOSFETs in recent literature. The self-consistent solver, which takes wave function penetration and other quantum mechanical (QM) effects into account, has been utilized here to establish the Capacitance-Voltage characteristics, using which the threshold voltage has been calculated. Effect of silicon channel thickness on threshold has been studied and a modification of classical analytical formula is proposed based on a fitting parameter, using the extracted threshold voltages.","PeriodicalId":122930,"journal":{"name":"2016 9th International Conference on Electrical and Computer Engineering (ICECE)","volume":"50 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Self-consistent determination of quantum-mechanical threshold voltage of Gate-All-Around Junction Less Nanowire Transistor\",\"authors\":\"Nujhat Tasneem, M. Adnan, M. Hafiz, Q. Khosru\",\"doi\":\"10.1109/ICECE.2016.7853874\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Quantum definition based threshold voltage calculation of Gate-All-Around Junction Less Nanowire Transistor has been presented in this work. Employment of this approach has not yet been achieved on GAA-JLNT even though similar determination was previously established for TG FinFETs and GAA-MOSFETs in recent literature. The self-consistent solver, which takes wave function penetration and other quantum mechanical (QM) effects into account, has been utilized here to establish the Capacitance-Voltage characteristics, using which the threshold voltage has been calculated. Effect of silicon channel thickness on threshold has been studied and a modification of classical analytical formula is proposed based on a fitting parameter, using the extracted threshold voltages.\",\"PeriodicalId\":122930,\"journal\":{\"name\":\"2016 9th International Conference on Electrical and Computer Engineering (ICECE)\",\"volume\":\"50 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 9th International Conference on Electrical and Computer Engineering (ICECE)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICECE.2016.7853874\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 9th International Conference on Electrical and Computer Engineering (ICECE)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICECE.2016.7853874","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Self-consistent determination of quantum-mechanical threshold voltage of Gate-All-Around Junction Less Nanowire Transistor
Quantum definition based threshold voltage calculation of Gate-All-Around Junction Less Nanowire Transistor has been presented in this work. Employment of this approach has not yet been achieved on GAA-JLNT even though similar determination was previously established for TG FinFETs and GAA-MOSFETs in recent literature. The self-consistent solver, which takes wave function penetration and other quantum mechanical (QM) effects into account, has been utilized here to establish the Capacitance-Voltage characteristics, using which the threshold voltage has been calculated. Effect of silicon channel thickness on threshold has been studied and a modification of classical analytical formula is proposed based on a fitting parameter, using the extracted threshold voltages.