{"title":"基于量子元胞自动机的五输入多数门容错多数门设计","authors":"Dhrubajyoti Bhowmik, Apu Saha, P. Dutta","doi":"10.1109/ICMETE.2016.114","DOIUrl":null,"url":null,"abstract":"Quantum-dot Cellular Automata (QCA) is a standout amongst the most alluring advances for figuring at nanoscale. The rule component in Quantum Cellular Automata is a majority gate. In this paper, fault-tolerance properties of the 5 input majority gate is studied. This segment is appropriate for outlining fault-tolerant Quantum Cellular Automata circuits. We examine fault-tolerance properties of three-input majority gate in terms of misalignment, missing, and dislocation cells. In order to authenticate the functionality of the suggested element some physical verifications using kink energy and computer simulations using QCA Designer tool are performed. Our outcomes plainly demonstrate that the excess variant of the majority gate is stronger than the standard style for this gate.","PeriodicalId":167368,"journal":{"name":"2016 International Conference on Micro-Electronics and Telecommunication Engineering (ICMETE)","volume":"118 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"A Novel Design to Obtain Fault Tolerant Majority Gate for Five Input Majority Gate by Quantum Cellular Automata\",\"authors\":\"Dhrubajyoti Bhowmik, Apu Saha, P. Dutta\",\"doi\":\"10.1109/ICMETE.2016.114\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Quantum-dot Cellular Automata (QCA) is a standout amongst the most alluring advances for figuring at nanoscale. The rule component in Quantum Cellular Automata is a majority gate. In this paper, fault-tolerance properties of the 5 input majority gate is studied. This segment is appropriate for outlining fault-tolerant Quantum Cellular Automata circuits. We examine fault-tolerance properties of three-input majority gate in terms of misalignment, missing, and dislocation cells. In order to authenticate the functionality of the suggested element some physical verifications using kink energy and computer simulations using QCA Designer tool are performed. Our outcomes plainly demonstrate that the excess variant of the majority gate is stronger than the standard style for this gate.\",\"PeriodicalId\":167368,\"journal\":{\"name\":\"2016 International Conference on Micro-Electronics and Telecommunication Engineering (ICMETE)\",\"volume\":\"118 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 International Conference on Micro-Electronics and Telecommunication Engineering (ICMETE)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICMETE.2016.114\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 International Conference on Micro-Electronics and Telecommunication Engineering (ICMETE)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICMETE.2016.114","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A Novel Design to Obtain Fault Tolerant Majority Gate for Five Input Majority Gate by Quantum Cellular Automata
Quantum-dot Cellular Automata (QCA) is a standout amongst the most alluring advances for figuring at nanoscale. The rule component in Quantum Cellular Automata is a majority gate. In this paper, fault-tolerance properties of the 5 input majority gate is studied. This segment is appropriate for outlining fault-tolerant Quantum Cellular Automata circuits. We examine fault-tolerance properties of three-input majority gate in terms of misalignment, missing, and dislocation cells. In order to authenticate the functionality of the suggested element some physical verifications using kink energy and computer simulations using QCA Designer tool are performed. Our outcomes plainly demonstrate that the excess variant of the majority gate is stronger than the standard style for this gate.