全内反射椭偏法在生物传感表面和界面现象研究中的应用

The Tenth International Conference on Advanced Semiconductor Devices and Microsystems Pub Date : 2014-10-01 DOI:10.1109/ASDAM.2014.6998699

J. Chlpík, K. Bombarová, Július Cirák

{"title":"全内反射椭偏法在生物传感表面和界面现象研究中的应用","authors":"J. Chlpík, K. Bombarová, Július Cirák","doi":"10.1109/ASDAM.2014.6998699","DOIUrl":null,"url":null,"abstract":"Ellipsometry, particularly spectroscopic ellipsometry, is a very sensitive, nondestructive experimental technique of thin film characterisation. The recently proposed method of Total internal reflection ellipsometry (TIRE) combines the advantages of spectroscopic ellipsometry and the Kretschmann type SPR geometry of total internal reflection. The modeling reveals detection limit of changes in the bulk refractive index, Δnb= 1.5×10-6 which represents the instrumental potential for detecting an analyte at several pmol/liter in a solution. These results were proven by experimental studies on monitoring changes in adsorbed layers (at the metal / dielectric interface) caused by specific binding of biomolecules from the surrounding solution.","PeriodicalId":313866,"journal":{"name":"The Tenth International Conference on Advanced Semiconductor Devices and Microsystems","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2014-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Total internal reflection ellipsometry in the investigation of phenomena at surfaces and interfaces for biosensing\",\"authors\":\"J. Chlpík, K. Bombarová, Július Cirák\",\"doi\":\"10.1109/ASDAM.2014.6998699\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Ellipsometry, particularly spectroscopic ellipsometry, is a very sensitive, nondestructive experimental technique of thin film characterisation. The recently proposed method of Total internal reflection ellipsometry (TIRE) combines the advantages of spectroscopic ellipsometry and the Kretschmann type SPR geometry of total internal reflection. The modeling reveals detection limit of changes in the bulk refractive index, Δnb= 1.5×10-6 which represents the instrumental potential for detecting an analyte at several pmol/liter in a solution. These results were proven by experimental studies on monitoring changes in adsorbed layers (at the metal / dielectric interface) caused by specific binding of biomolecules from the surrounding solution.\",\"PeriodicalId\":313866,\"journal\":{\"name\":\"The Tenth International Conference on Advanced Semiconductor Devices and Microsystems\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2014-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"The Tenth International Conference on Advanced Semiconductor Devices and Microsystems\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ASDAM.2014.6998699\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"The Tenth International Conference on Advanced Semiconductor Devices and Microsystems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ASDAM.2014.6998699","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 0

摘要

椭偏仪，特别是光谱椭偏仪，是一种非常灵敏、无损的薄膜表征实验技术。最近提出的全内反射椭圆偏振法(TIRE)结合了光谱椭偏法的优点和全内反射的Kretschmann型SPR几何结构。该模型揭示了体折射率变化的检测极限，Δnb= 1.5×10-6，它代表了在溶液中检测数pmol/l分析物的仪器潜力。这些结果通过监测吸附层(在金属/电介质界面)的变化的实验研究得到了证实，这些变化是由周围溶液中生物分子的特异性结合引起的。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

查看原文本刊更多论文

Total internal reflection ellipsometry in the investigation of phenomena at surfaces and interfaces for biosensing

Ellipsometry, particularly spectroscopic ellipsometry, is a very sensitive, nondestructive experimental technique of thin film characterisation. The recently proposed method of Total internal reflection ellipsometry (TIRE) combines the advantages of spectroscopic ellipsometry and the Kretschmann type SPR geometry of total internal reflection. The modeling reveals detection limit of changes in the bulk refractive index, Δnb= 1.5×10-6 which represents the instrumental potential for detecting an analyte at several pmol/liter in a solution. These results were proven by experimental studies on monitoring changes in adsorbed layers (at the metal / dielectric interface) caused by specific binding of biomolecules from the surrounding solution.

求助全文

通过发布文献求助，成功后即可免费获取论文全文。去求助

来源期刊

The Tenth International Conference on Advanced Semiconductor Devices and Microsystems

自引率

0.00%

发文量