{"title":"应力对非晶碳薄膜和多壁碳纳米管-聚合物复合材料场发射性能的影响","authors":"C. Poa, R. Lacerda, S. Silva, F. C. Marques","doi":"10.1109/IVNC.2004.1354968","DOIUrl":null,"url":null,"abstract":"This work investigates the effects of stress on carbon-based materials during field emission. Amorphous carbon films containing nano-crystalline particles and MWNT composite thin films are subjected to external stress by mechanical bending. The samples were bent using an optical fibre placed in the middle of the sample. Field emission properties were measured using the probe technique.","PeriodicalId":137345,"journal":{"name":"Technical Digest of the 17th International Vacuum Nanoelectronics Conference (IEEE Cat. No.04TH8737)","volume":"79 3 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2004-07-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Influence of stress on the field emission properties of amorphous carbon thin films and multiwall carbon nanotube-polymer composites\",\"authors\":\"C. Poa, R. Lacerda, S. Silva, F. C. Marques\",\"doi\":\"10.1109/IVNC.2004.1354968\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This work investigates the effects of stress on carbon-based materials during field emission. Amorphous carbon films containing nano-crystalline particles and MWNT composite thin films are subjected to external stress by mechanical bending. The samples were bent using an optical fibre placed in the middle of the sample. Field emission properties were measured using the probe technique.\",\"PeriodicalId\":137345,\"journal\":{\"name\":\"Technical Digest of the 17th International Vacuum Nanoelectronics Conference (IEEE Cat. No.04TH8737)\",\"volume\":\"79 3 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2004-07-11\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Technical Digest of the 17th International Vacuum Nanoelectronics Conference (IEEE Cat. No.04TH8737)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IVNC.2004.1354968\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Technical Digest of the 17th International Vacuum Nanoelectronics Conference (IEEE Cat. No.04TH8737)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IVNC.2004.1354968","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Influence of stress on the field emission properties of amorphous carbon thin films and multiwall carbon nanotube-polymer composites
This work investigates the effects of stress on carbon-based materials during field emission. Amorphous carbon films containing nano-crystalline particles and MWNT composite thin films are subjected to external stress by mechanical bending. The samples were bent using an optical fibre placed in the middle of the sample. Field emission properties were measured using the probe technique.