{"title":"一种新的可靠性预测工具","authors":"W. Denson, S. Keene","doi":"10.1109/RAMS.1998.653533","DOIUrl":null,"url":null,"abstract":"The structure of a new reliability methodology for electronic systems is presented. Reliability prediction tool has two aspects. First it is used in a priori fashion to scale an initial reliability prediction based upon which development process initiatives are used. Secondly, the model does a \"data fusion\" or integration of all reliability data derived over the duration of the development process. One feature is that the new model introduces a variance measure into the MTBF prediction. The CAE presentation focuses on the a priori part of the model since that is deemed to operationalize a concurrent engineering focus in a timely manner for new product development.","PeriodicalId":275301,"journal":{"name":"Annual Reliability and Maintainability Symposium. 1998 Proceedings. International Symposium on Product Quality and Integrity","volume":"40 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1998-01-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"A new reliability prediction tool\",\"authors\":\"W. Denson, S. Keene\",\"doi\":\"10.1109/RAMS.1998.653533\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The structure of a new reliability methodology for electronic systems is presented. Reliability prediction tool has two aspects. First it is used in a priori fashion to scale an initial reliability prediction based upon which development process initiatives are used. Secondly, the model does a \\\"data fusion\\\" or integration of all reliability data derived over the duration of the development process. One feature is that the new model introduces a variance measure into the MTBF prediction. The CAE presentation focuses on the a priori part of the model since that is deemed to operationalize a concurrent engineering focus in a timely manner for new product development.\",\"PeriodicalId\":275301,\"journal\":{\"name\":\"Annual Reliability and Maintainability Symposium. 1998 Proceedings. International Symposium on Product Quality and Integrity\",\"volume\":\"40 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1998-01-19\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Annual Reliability and Maintainability Symposium. 1998 Proceedings. International Symposium on Product Quality and Integrity\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/RAMS.1998.653533\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Annual Reliability and Maintainability Symposium. 1998 Proceedings. International Symposium on Product Quality and Integrity","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/RAMS.1998.653533","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
The structure of a new reliability methodology for electronic systems is presented. Reliability prediction tool has two aspects. First it is used in a priori fashion to scale an initial reliability prediction based upon which development process initiatives are used. Secondly, the model does a "data fusion" or integration of all reliability data derived over the duration of the development process. One feature is that the new model introduces a variance measure into the MTBF prediction. The CAE presentation focuses on the a priori part of the model since that is deemed to operationalize a concurrent engineering focus in a timely manner for new product development.