基于多帧技术的表面粗糙度测量应用

Tanaporn Leelawattananon, W. Thowladda, S. Chittayasothorn
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引用次数: 6

摘要

本文介绍了高度光滑表面粗糙度测量的计算机应用。采用非接触式相移干涉测量技术进行粗糙度测量。我们的光学测量系统采用波长为632.8 nm的0.5 mW He-Ne激光源。测量系统的条纹由高精度相机记录,并通过我们的程序进行分析,以产生表面粗糙度测量。这项技术是一种简单的技术,可以给出准确的结果。它是一种四帧算法,其结果与更复杂的五帧算法相似,处理时间更短。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Surface Roughness Measurement Application Using Multi-frame Techniques
This paper presents a computer application of the surface roughness measurement of highly smooth surfaces. The Phase Shifting Interferometry technique which is a non-contact technique is applied for the roughness measurement. Our optic-based measurement system utilizes a 0.5 mW He-Ne laser source with the wavelength of 632.8 nm. Fringes from the measurement system were recorded using a high precision camera and were analyzed by our programs to produce the surface roughness measurement. This technique is a simple technique which gives accurate results. It is a four-frame algorithm giving similar results to the more complex five-frame one with less processing time.
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