考虑多周期影响的后硅验证信号选择

A. Bhattacharya, Subhasis Koley, A. Banerjee
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引用次数: 0

摘要

后硅验证是芯片设计生命周期中的重要步骤。这包括观察芯片的信号元素,以检查信号是否有预期的值。该过程本质上需要观察给定已知输入的电路行为(即信号值),并检查其正确性和一致性。在硅后验证步骤中存储信号值的跟踪缓冲区的大小限制了可以观察到的信号的数量。在给定跟踪缓冲区大小约束的情况下,确定要监视的最佳信号集是一项重要任务。在本文中,我们提出了一种信号选择算法,该算法允许我们选择在跟踪时比现有技术提供更好恢复的信号。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Considering multi-cycle influences for signal selection for Post Silicon Validation
Post-silicon validation is an important step in the chip design life cycle. This involves observing the signal elements of the chip to check if the signals have the expected values. The process essentially requires observing the circuit behaviour (i.e. the signal values) on giving known inputs, and checking for correctness and conformance. The size of the trace buffer which stores the values of the signals during the post-silicon validation step, limits the number of signals that can be observed. Deciding the best signal set to monitor given the constraint on the size of the trace buffer is an important task. In this paper, we present an algorithm for signal selection, that allows us to select signals which, on traced, gives us better restoration than existing techniques.
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