Dimitar Zlatev, A. Georgiev, T. Papanchev, J. Garipova, Tereza Stefanova Stefanova
{"title":"谐振式全桥逆变器中mosfet的可靠性建模","authors":"Dimitar Zlatev, A. Georgiev, T. Papanchev, J. Garipova, Tereza Stefanova Stefanova","doi":"10.1109/ET.2018.8549590","DOIUrl":null,"url":null,"abstract":"This paper concerns reliability modeling of the MOSFET transistors in a full bridge inverter with series resonance at the load circuit. Taking into account the resonant process and its parameters a model concerning transistors reliability in such an inverter is obtained. The dependencies of the MOSFETs reliability on some of the resonant circuit parameters are shown in a graphical form.","PeriodicalId":374877,"journal":{"name":"2018 IEEE XXVII International Scientific Conference Electronics - ET","volume":"317 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":"{\"title\":\"Reliability Modeling of MOSFETs in Resonant Full Bridge Inverter\",\"authors\":\"Dimitar Zlatev, A. Georgiev, T. Papanchev, J. Garipova, Tereza Stefanova Stefanova\",\"doi\":\"10.1109/ET.2018.8549590\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper concerns reliability modeling of the MOSFET transistors in a full bridge inverter with series resonance at the load circuit. Taking into account the resonant process and its parameters a model concerning transistors reliability in such an inverter is obtained. The dependencies of the MOSFETs reliability on some of the resonant circuit parameters are shown in a graphical form.\",\"PeriodicalId\":374877,\"journal\":{\"name\":\"2018 IEEE XXVII International Scientific Conference Electronics - ET\",\"volume\":\"317 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2018-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"7\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2018 IEEE XXVII International Scientific Conference Electronics - ET\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ET.2018.8549590\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 IEEE XXVII International Scientific Conference Electronics - ET","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ET.2018.8549590","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Reliability Modeling of MOSFETs in Resonant Full Bridge Inverter
This paper concerns reliability modeling of the MOSFET transistors in a full bridge inverter with series resonance at the load circuit. Taking into account the resonant process and its parameters a model concerning transistors reliability in such an inverter is obtained. The dependencies of the MOSFETs reliability on some of the resonant circuit parameters are shown in a graphical form.