跨越行为和结构领域边界的高水平测试综合

Proceedings International Conference on Computer Design VLSI in Computers and Processors Pub Date : 1997-10-12 DOI:10.1109/ICCD.1997.628932

Kowen Lai, C. Papachristou, M. Baklashov

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引用次数: 6

摘要

高水平测试合成(High level test synthesis, HLTS)是近年来出现的一个术语，它有望自动提高电路的可测试性。作者展示了HLTS如何为面向BIST的测试方法实现更高的可测试性。结果表明，考虑高阶合成时的可测性，与低阶合成时的DFT相比，可获得更好的可测性。可测试性转换允许对可测试性进行行为修改，这是一种非常强大的HLTS技术。

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High level test synthesis across the boundary of behavioral and structural domains

High level test synthesis (HLTS), a term introduced in recent years, promises automatic enhancement of testability of a circuit. The authors show how HLTS can achieve higher testability for BIST oriented test methodologies. Their results show considering testability during high-level synthesis, better testability can be obtained when compared to DFT at low level. Transformation for testability, which allows behavioral modification for testability, is a very powerful HLTS technique.

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Proceedings International Conference on Computer Design VLSI in Computers and Processors

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