印刷电路板走线的最坏情况耦合电压分析

K. Durbhakula, Ahmed M. Hassan, A. Caruso
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引用次数: 1

摘要

对各种印制电路板(PCB)走线形状的最坏情况耦合电压进行了详细研究。考虑了不同的走线长度和走线形状,探讨了最坏耦合电压在外加电磁场作用下的响应。作为第一步,对直线PCB走线负载的耦合电压进行解析计算,并与现有的全波电磁(EM)求解器在特定频谱上进行比较。利用Parseval定理推导出的最坏耦合电压对一定走线长度的频率相关耦合电压进行平均。最后的比较结果表明,特定的PCB走线形状与电磁场的耦合较小,而与其长度无关。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Worst-Case Coupled Voltage Analysis of Printed Circuit Board Traces
A detailed worst-case coupled voltage study on various printed circuit board (PCB) trace shapes has been carried out. Different trace lengths and trace shapes have been considered to explore the response from worst-case coupled voltage under external electromagnetic field. As a first step, the coupled voltage to loads of a straight PCB trace is analytically calculated and compared with existing full-wave electromagnetic (EM) solver over a particular frequency spectrum. The worst-case coupled voltage, which is derived using the Parseval’s theorem averages out the frequency dependent coupled voltage for a certain trace length. The final comparative results indicate that a specific PCB trace shape couples less to EM field irrespective of its length.
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