为高性能压缩flash文件系统添加积极的纠错功能

Yangwook Kang, E. L. Miller
{"title":"为高性能压缩flash文件系统添加积极的纠错功能","authors":"Yangwook Kang, E. L. Miller","doi":"10.1145/1629335.1629376","DOIUrl":null,"url":null,"abstract":"While NAND flash memories have rapidly increased in both capacity and performance and are increasingly used as a storage device in many embedded systems, their reliability has decreased both because of increased density and the use of multi-level cells (MLC). Current MLC technology only specifies the minimum requirement for an error correcting code (ECC), but provides no additional protection in hardware. However, existing flash file systems such as YAFFS and JFFS2 rely upon ECC to survive small numbers of bit errors, but cannot survive the larger numbers of bit errors or page failures that are becoming increasingly common as flash file systems scale to multiple gigabytes.\n We have developed a flash memory file system, RCFFS, that increases reliability by utilizing algebraic signatures to validate data and Reed-Solomon codes to correct erroneous or missing data. Our file system allows users to adjust the level of reliability they require by specifying the number of redundancy pages for each erase block,allowing them to dynamically trade off reliability and storage overhead. By integrating error mitigation with advanced features such as fast mounting and compression, we show, via simulation in NANDsim, that our file system can outperform YAFFS and JFFS2 while surviving flash memory errors that would cause data loss for existing flash file systems.","PeriodicalId":143573,"journal":{"name":"International Conference on Embedded Software","volume":"517 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-10-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"35","resultStr":"{\"title\":\"Adding aggressive error correction to a high-performance compressing flash file system\",\"authors\":\"Yangwook Kang, E. L. Miller\",\"doi\":\"10.1145/1629335.1629376\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"While NAND flash memories have rapidly increased in both capacity and performance and are increasingly used as a storage device in many embedded systems, their reliability has decreased both because of increased density and the use of multi-level cells (MLC). Current MLC technology only specifies the minimum requirement for an error correcting code (ECC), but provides no additional protection in hardware. However, existing flash file systems such as YAFFS and JFFS2 rely upon ECC to survive small numbers of bit errors, but cannot survive the larger numbers of bit errors or page failures that are becoming increasingly common as flash file systems scale to multiple gigabytes.\\n We have developed a flash memory file system, RCFFS, that increases reliability by utilizing algebraic signatures to validate data and Reed-Solomon codes to correct erroneous or missing data. Our file system allows users to adjust the level of reliability they require by specifying the number of redundancy pages for each erase block,allowing them to dynamically trade off reliability and storage overhead. By integrating error mitigation with advanced features such as fast mounting and compression, we show, via simulation in NANDsim, that our file system can outperform YAFFS and JFFS2 while surviving flash memory errors that would cause data loss for existing flash file systems.\",\"PeriodicalId\":143573,\"journal\":{\"name\":\"International Conference on Embedded Software\",\"volume\":\"517 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2009-10-12\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"35\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"International Conference on Embedded Software\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1145/1629335.1629376\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"International Conference on Embedded Software","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/1629335.1629376","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 35

摘要

虽然NAND闪存在容量和性能方面都得到了迅速的提高,并且在许多嵌入式系统中越来越多地用作存储设备,但由于密度的增加和多级单元(MLC)的使用,它们的可靠性降低了。目前的MLC技术只规定了对纠错码(ECC)的最低要求,但在硬件上没有提供额外的保护。但是,现有的flash文件系统(如YAFFS和JFFS2)依赖ECC来处理少量的位错误,但无法处理随着flash文件系统扩展到多个gb而变得越来越常见的大量位错误或页面失败。我们开发了一种闪存文件系统RCFFS,它通过使用代数签名来验证数据和Reed-Solomon代码来纠正错误或丢失的数据,从而提高了可靠性。我们的文件系统允许用户通过指定每个擦除块的冗余页面数量来调整他们所需的可靠性级别,从而允许他们动态地权衡可靠性和存储开销。通过将错误缓解与快速挂载和压缩等高级特性集成在一起,我们通过NANDsim中的模拟显示,我们的文件系统可以在保留可能导致现有闪存文件系统数据丢失的闪存错误的情况下优于YAFFS和JFFS2。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Adding aggressive error correction to a high-performance compressing flash file system
While NAND flash memories have rapidly increased in both capacity and performance and are increasingly used as a storage device in many embedded systems, their reliability has decreased both because of increased density and the use of multi-level cells (MLC). Current MLC technology only specifies the minimum requirement for an error correcting code (ECC), but provides no additional protection in hardware. However, existing flash file systems such as YAFFS and JFFS2 rely upon ECC to survive small numbers of bit errors, but cannot survive the larger numbers of bit errors or page failures that are becoming increasingly common as flash file systems scale to multiple gigabytes. We have developed a flash memory file system, RCFFS, that increases reliability by utilizing algebraic signatures to validate data and Reed-Solomon codes to correct erroneous or missing data. Our file system allows users to adjust the level of reliability they require by specifying the number of redundancy pages for each erase block,allowing them to dynamically trade off reliability and storage overhead. By integrating error mitigation with advanced features such as fast mounting and compression, we show, via simulation in NANDsim, that our file system can outperform YAFFS and JFFS2 while surviving flash memory errors that would cause data loss for existing flash file systems.
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