光谱故障定位中的对偶现象

L. Naish, H. Lee
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引用次数: 20

摘要

在谱错误定位中,大量的集合相似度度量被用于对代码的“可疑性”进行排序,它使用通过和失败的测试用例的执行概要来帮助定位错误。数据挖掘的研究已经确定了相似度量中可能需要的几种对称形式。在这里,我们根据这些对称形式定义了度量的几种“对偶”形式。使用这些双重性,再加上其他一些轻微的修改,产生了几个新的相似性度量。我们展示了先前提出的几个度量标准的版本对于定位单个bug来说是最优的,或者接近最优的。我们还展示了在定位单个错误和定位“确定性”错误(其执行总是导致测试用例失败)之间存在一种形式的对偶性。各种单个bug最优度量的对偶对于定位此类bug是最优的。这一更具理论性的工作引出了一个猜想,即如何为软件开发的不同阶段选择不同的度量标准。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Duals in Spectral Fault Localization
Numerous set similarity metrics have been used for ranking "suspiciousness" of code in spectral fault localization, which uses execution profiles of passed and failed test cases to help locate bugs. Research in data mining has identified several forms of possibly desirable symmetry in similarity metrics. Here we define several forms of "duals" of metrics, based on these forms of symmetries. Use of these duals, plus some other slight modifications, leads to several new similarity metrics. We show that versions of several previously proposed metrics are optimal, or nearly optimal, for locating single bugs. We also show that a form of duality exists between locating single bugs and locating "deterministic" bugs (execution of which always results in test case failure). Duals of the various single bug optimal metrics are optimal for locating such bugs. This more theoretical work leads to a conjecture about how different metrics could be chosen for different stages of software development.
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