{"title":"集成半导体光电探测器的超表面超薄圆偏振分析仪","authors":"Junghoon Park, Kyoungsik Yu","doi":"10.23919/MOC.2017.8244629","DOIUrl":null,"url":null,"abstract":"We report on a metal-dielectric-metal (MDM) waveguide-based circular polarization analyzer with a sub-micron-scale thickness. By integrating nano-aperture metasurface and semiconductor photodetectors with the MDM structure, we can discriminate the handedness of circularly polarized light directly from the photocurrents without the usage of conventional optical components.","PeriodicalId":123743,"journal":{"name":"2017 22nd Microoptics Conference (MOC)","volume":"23 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Metasurface-based ultra-thin circular polarization analyzer integrated with semiconductor photodetectors\",\"authors\":\"Junghoon Park, Kyoungsik Yu\",\"doi\":\"10.23919/MOC.2017.8244629\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We report on a metal-dielectric-metal (MDM) waveguide-based circular polarization analyzer with a sub-micron-scale thickness. By integrating nano-aperture metasurface and semiconductor photodetectors with the MDM structure, we can discriminate the handedness of circularly polarized light directly from the photocurrents without the usage of conventional optical components.\",\"PeriodicalId\":123743,\"journal\":{\"name\":\"2017 22nd Microoptics Conference (MOC)\",\"volume\":\"23 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2017-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2017 22nd Microoptics Conference (MOC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.23919/MOC.2017.8244629\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 22nd Microoptics Conference (MOC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.23919/MOC.2017.8244629","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Metasurface-based ultra-thin circular polarization analyzer integrated with semiconductor photodetectors
We report on a metal-dielectric-metal (MDM) waveguide-based circular polarization analyzer with a sub-micron-scale thickness. By integrating nano-aperture metasurface and semiconductor photodetectors with the MDM structure, we can discriminate the handedness of circularly polarized light directly from the photocurrents without the usage of conventional optical components.
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