M. Fratz, T. Seyler, A. Schiller, A. Bertz, D. Carl
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Extended depth of field with absolute position detection in multi-wavelength digital holography
We present a novel approach for detecting the absolute position of surfaces in multi-wavelength holography. We extent the depth of field from ~0.08 mm to ~3 mm and get the absolute position with accuracies better than10 µm.